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Message ID: 8     Entry time: Mon Dec 8 11:54:36 2014
Author: Yujing Sun 
Type: SiPM after pulsing, dark rate and amplifier calibration data taking 
Subject: SiPM after pulsing, dark rate and amplifier calibration data taking 

The first PCB has an unreachable std output connector while the second one has a broken fast output connector.

All the data taking are in the cryostat and using Bandwith filter 20MHz, NF 3bits and sampling rate 10GS/s, unless specified.

Dec 3  2014 (10:40 am to 5:40 pm): C-series SiPM 1, 2 and 3.         PCB #3 (all good fast and std outputs)
                                                              Afterpulsing and fastoutput gain data taking was on all SiPMs (no filter on oscilloscope [1]), bias V=23~28 V. (Test the Bandwith and NF effect on fast output)
Dec 4  2014 (10:00 am to 9:30 pm): C-series SiPM 1, 2 and 3.        PCB #3 (all good fast and std outputs)
                                                              Dark rate data taking was on all SiPMs (no filter on oscilloscope [1]), bias V=23~28 V. (Test the Bandwith and NF effect on standard output)
Dec 5  2014 (3:00 pm to 10:00 pm): C-series SiPM 1, 2 and 3.        PCB #3 (all good fast and std outputs)
                                                              Amplifier test data taking (1000 events per overvoltage, 1GS/s) was on all SiPMs, bias V=26~30 V. (roomtemp)
                                                              Amplifier test data taking (5000 events per overvoltage) was on all SiPMs, bias V=23~28 V.

 

[1] "No filter on oscilloscope" means Bandwith full, NF none

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